Phoenix Inspectify combines inspection and verification in one system allowing to perform both processes in one cycle (hence the name "Inspectify"). It's capable of scanning minimum line/space width of 30 µm and is ideally suited for low-medium volume, high mix manufacturers.
The system's new optical technology Microlight™ provides flexible light coverage by combining superior image with customizable detection requirements.
Equipped with the state-of-the-art image acquisition and advanced software capabilities, the Phoenix product family has proven exceptional detection combined with a well- balanced, non-critical defects rate.
Phoenix Inspectify is powered by Spark™ - an innovative cross-platform detection engine.
2CD - critical dimension
CRS / PX - offline reference station
Low Contrast Materials - DSTF, Double Treated and other low contrast materials
PRI (Photo Resist Inspection) - Allows inspection of Photo-Resist
For additional information on our products, please contact us
More In Camtek PCB, IC Substrate & Touch Panel
Phoenix PT is specially designed for main-stream Large Area Masks (LAM) and artwork inspection. It offers
unparalleled detection ability on LAM with down to 25 μm line/space width technology.
The CVR 100-FL is designed for verification and repair of ultra fine line PCB panels in main-stream and mass production PCB shops.
Phoenix Nano, the next generation of ultra-high resolution AOI, is capable to scan line width of down to 5 µm.
he CVR 100-IC is designed for verification and repair of high-end panels for IC Substrate applications.
Camtek’s verification and Repair system (CVR 100-IC) has outstanding image clarity and magnification. Its high throughput, friendly operation and ergonomic design offer the ideal verification tool.
Phoenix Touch was designed specifically for touch screen market and is capable of scanning large variery of products and applications. Phoenix Touch can scan minimum 30 µm line/space width of conductive traces on touch screen panels and is suitable for all types of designs.