Camtek latest AVI system is designed for inspection of IC Substrates with line/space down to 15 µm. Unicorn 300 is a multiple resolution system with minimum pixel of 3.8 µm, suitable to scan large variety of materials and designs.
Unicorn AVI systems incorporate all Camtek’s latest technologies that were specifically developed for ultra-high resolution AOI systems, as well as advanced optics, image acquisition and processing hardware and software.
Unicorn systems are designed to meet the most sophisticated detection requirements of highly advanced IC Substrates makers, while scanning at high throughput and with minimum false calls.
Camtek Reference Station (CRS) - offline job preparation and processing
Pegasus Verification Station (PVS) - standalone verification station
Antistatic vacuum brush cleaner - integrated automated strip cleaner
Barcode reader - optional reading of 2D and 3D barcodes
Printer - for printing various job info
Ionizer - optional antistatic device
For additional information on our products, please contact us
More In Camtek PCB, IC Substrate & Touch Panel
Phoenix R2R has been specifically design for R2R (Reel-to-Reel) process with capabilities to scan down to 25 µm line/space width products. Thanks to its flexible configuration, compatibility with the wide range of R2R automation solutions and both online and offline verification options, Phoenix R2R is currently the best selling AOI solution for R2R PCB market.
The Phoenix, Camtek’s new generation AOI system, was designed to support high volume manufacturing of HDI and high-end PCB
Camtek latest AVI system is designed for inspection of IC Substrates with line/space down to 5 µm. Unicorn 1200 is a multiple resolution system with minimum pixel of 1.6 µm, suitable to scan large variety of materials and designs.
Phoenix Nano, the next generation of ultra-high resolution AOI, is capable to scan line width of down to 5 µm.
With advanced image acquisition and software capabilities, the Phoenix product family has proven exceptional detection skills combined with a well- balanced, non-critical defects rate.