Designed for the high production volume environment, the Condor 900 product series is the ideal choice for inspection and metrology addressing the most demanding semiconductor market applications and the emerging 3D-IC market.
Powered by Camtek's fifth generation unique white light triangulation technology
The Condor 900 Product Series
Camtek's fifth generation inspection and metrology system for advanced packaging and macro defect inspection
Condor 902 - for 200mm wafers
Condor 903 - for 300 mm wafers
For additional information on our products, please contact us.
More In Camtek Semiconductor
Designed to manage the most critical issues of LED applications inspection, Condor 5LED includes advanced software alignment functionality.
The Eagle-AP provides both 2D and 3D inspection and metrology on the same platform, while keeping extremely high performance and throughput levels.
The Condor 203 is a versatile, fully automated, optical inspection platform for special applications such as LED, MEMS, optical and medical devices, designed to inspect framed or unframed wafers and various thickness.
The Condor PD Series is targeting post dicing metrology defect inspection at High Volume Manufacturing (HVM). Inspection is conducted while dice are still in wafer format — the last opportunity to add essential information to the wafer map.
Condor 300 ensures that bumps, gold bumps, micro bumps and TSV meet their tight dimensional tolerances and are correctly positioned as well as defect controlled.