The Eagle Product Family is designed to support the semiconductor industry from R&D to the high production volume environment.
Eagle-i is the most advanced system for 2D surface defect inspection and metrology
High volume production 2D inspection solutions for:
Unique solutions for:
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More In Camtek Semiconductor
The Condor PD Series is targeting post dicing metrology defect inspection at High Volume Manufacturing (HVM). Inspection is conducted while dice are still in wafer format — the last opportunity to add essential information to the wafer map.
Designed to manage the most critical issues of LED applications inspection, Condor 5LED includes advanced software alignment functionality.
Eagle-i s the most advanced system for 2D surface defect inspection and metrology, delivering High volume production 2D inspection solutions for Pre and post-bumped wafers, Probe Mark Inspection, OQc and more.
The Eagle-AP provides both 2D and 3D inspection and metrology on the same platform, while keeping extremely high performance and throughput levels.
The Condor 203 is a versatile, fully automated, optical inspection platform for special applications such as LED, MEMS, optical and medical devices, designed to inspect framed or unframed wafers and various thickness.