Camtek provides dedicated inspection and metrology solutions to address the special requirements of LED manufacturing process.
Our LED inspection and metrology capabilities include a unique ability to inspect and process a huge amount of data (over 500,000 dice per wafer) in real time. Our systems are equipped with special optics and illumination designed specifically for this industry.
Capabilities• 500,000 dice per wafer processing
• Classification capabilities
• Stretched wafer capability
Technologies• Advanced processing engines for defect inspection and metrology
• High resolution 3D confocal sensor
Eagle-i s the most advanced system for 2D surface defect inspection and metrology, delivering High volume production 2D inspection solutions for Pre and post-bumped wafers, Probe Mark Inspection, OQc and more.