Camtek provides dedicated inspection and metrology solutions to address the special requirements of LED manufacturing process.

Our LED inspection and metrology capabilities include a unique ability to inspect and process a huge amount of data (over 500,000 dice per wafer) in real time. Our systems are equipped with special optics and illumination designed specifically for this industry.


• 500,000 dice per wafer processing
• Classification capabilities
• Stretched wafer capability


• Advanced processing engines for defect inspection and metrology
• High resolution 3D confocal sensor



Eagle-i s the most advanced system for 2D surface defect inspection and metrology, delivering High volume production 2D inspection solutions for Pre and post-bumped wafers, Probe Mark Inspection, OQc and more.