Yield Management Solution

Camtek’s new comprehensive software package offers an open and flexible database configuration and a set of tools designed to improve production and yield by data enhancement using manual and automatic tools and analysis capabilities.
The tools combine machine learning and data mining capabilities that optimize the process and minimize the time between an event and the reaction.


Products

Camtek's YMS includes:

Easy to use interface
Flexible connectivity for various input types (defects, equipment data, system status, metrology information, etc.)
Advanced map analysis (SSA) capabilities – automatic detection, classification, and quantification of systematic patterns of wafer maps and cross process
Reporting: charts and graphs providing visual presentation of the collected data
Easy to use interface
Flexible connectivity for various input types (defects, equipment data, system status, metrology information, etc.)
Advanced map analysis (SSA) capabilities – automatic detection, classification, and quantification of systematic patterns of wafer maps and cross process
Reporting: charts and graphs providing visual presentation of the collected data
  • Easy to use interface
  • Flexible connectivity for various input types (defects, equipment data, system status, metrology information, etc.)
  • Advanced map analysis (SSA) capabilities – automatic detection, classification, and quantification of systematic patterns of wafer maps and cross process
  • Reporting: charts and graphs providing visual presentation of the collected data