Layer Thickness Measurement
Thin layers applied in various packaging process steps require special metrology to assure layer’s uniformity and quality. Camtek’s proprietary layer thickness sensor provides sub-micron measurement capabilities enabling the light interferences to bounce back from the coated surface thus retrieving the layer’s coating thickness.
- Thin layers metrology applied during packaging process steps
- Sub-micron and multi-layer thickness metrology
- Can be implemented in both development and high volume manufacturing environments