SAMSUNG SELECTS CAMTEK’S FALCON FOR WAFER INSPECTION AT ELECTRICAL TEST FACILITY
MIGDAL HA’EMEK, Israel, January 9, 2008 – Camtek Ltd. (Nasdaq: CAMT; TASE: CAMT)
announced today that it has sold two Falcon wafer inspection systems to Samsung Electronics Co.
The two systems were installed at Samsung’s test facility in Korea during the fourth quarter of 2007, following a competitive evaluation.
Mr. Y.S. Kang, General Manager of Camtek Korea, said: “Samsung’s demanding quality control requires strict inspection of interconnect areas to ensure the reliability of the semiconductor device.
At the same time, Samsung requires high throughput. The Falcon met these requirements by implementing an advanced automated scanning protocol that delivers the combination of acute defect detection with superb productivity”.
Camtek’s line of automated wafer inspection systems, Falcon, helps semiconductor manufacturers, bumping houses and packaging foundries monitor processes and enhance yield.
Falcon dedicated models deliver superb 2D and 3D inspection and metrology capabilities for wafers before or after test, along the bumping process or after dicing, as well as the special needs of MEMS applications.