Products
Camtek’s new comprehensive software package offers an open and flexible database configuration and a set of tools designed to improve production and yield by data enhancement using manual and automatic tools and analysis capabilities.
The tools combine machine learning and data mining capabilities that optimize the process and minimize the time between an event and the reaction.
Automatic Defect Classification (ADC)
Camtek’s ADC is an advanced image-based automatic classification solution, based on state-of-the-art machine learning technologies. The software combines learning capabilities with production stability and procedures, which support learning curves while maintaining production quality requirements.
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Compass
Compass is a powerful, KLARF based, analytic tool, designed to help you analyze and visualize defect inspection results to increase productivity and yield.
Compass offers an automatic alert system which identifies in real time values that do not meet the range of production specifications, for example too many defects per wafer/lot, and triggers an alert that includes an e-mail notification notice.
Manual Defect Classification
Camtek's Manual Defect Classification offers a comprehensive classification environment including three basic elements: Classification client, Review client and Management client.