Products
Camtek integrates advanced AI technologies into inspection and metrology, creating an intelligent ecosystem that learns, adapts, and continuously improves performance across semiconductor manufacturing processes.
Our AI-powered solutions enhance defect detection, automate classification, improve measurement accuracy, and enable data-driven decision-making — helping fabs increase yield, efficiency, and process control.
2D AI-Based Defect Detection
Camtek’s 2D AI-Based Defect Detection is an advanced image-based inspection solution designed to deliver highly accurate and reliable defect identification using state-of-the-art AI technologies.
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AI Classification (AiDC)
Camtek’s real-time AiDC solution revolutionizes defect classification by bringing AI directly into the inspection process. By automatically classifying defects, AiDC eliminates manual review efforts, reduces human error, and delivers fast, consistent results.
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Enhanced Detection Capabilities (EDC)
Camtek’s Enhanced Detection Capabilities (EDC) is an AI-powered defect filtering solution designed to improve inspection efficiency by intelligently distinguishing between critical and non-critical defects in real time. EDC is fully integrated into Camtek's software platform and is included as a standard capability across our software solutions.
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